Transmission electron microscopy (TEM) is an imaging technique whereby a beam of electrons is focused onto a specimen causing an enlarged version to appear on a fluorescent screen, layer of photographic film or CCD camera. The main output is detail topography of the objects in nanometer scale.
In addition the SAED (Selected area electron diffraction) could bring the analytical data, similar as XRD.
|Applied to:||particle size determination, particle morphology determination, chemical compounds determination, sample crystallinity description|
|Maintained by:||Klára Šafářová|
|Point to Point Resolution:||0.194 nm|
|Acc. Voltage:||80–200 kV|
|Year of Production:||2005|