RNDr. Pavel Pavlíček, Ph.D.

Contact:

Email: Pavel.Pavlicek@upol.cz
Address: 17. listopadu 50a, Olomouc, 772 07, Czech Republic
Phone: (+420) 585 631 680

Fax: (+420) 585 631 531


Research activities

  • Development of 3D sensors and their application, research of physical limits of 3D sensors.

Professional

1999 Ph.D. Optics, Friedrich-Alexander-University Erlangen-Nuremberg
1999 Researcher, Joint Laboratory of Optics
2011 Member of the project RCPTM-Team

International experience

  • 2004 (Apr – Sep) at UEC Tokyo, Japan, group of Prof. M. Takeda,
  • 2012 (May) at University Stuttgart, group of Prof. W. Osten.
  • 2014 (July) at University Stuttgart, group of Prof. W. Osten.

Publication activities

Author or co-author of 8 papers in international journals. More than 90 citations, h-index: 5.

Selected best publications in last 5 years

  1. P. Pavlíček, Optical methods for the measurement of the shape of objects and their measurement uncertainty, 19th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics, edited by Agnieszka Popiołek-Masajada, Wacław Urbańczyk, Proc. of SPIE Vol. 9441, 94411K-1 – 94411K-8 (2014).
  2. P. Pavlíček, G. Häusler, Methods for optical shape measurement and their measurement uncertainty. International Journal of Optomechatronics 8, 292 – 303 (2014).
  3. P. Pavlíček and V. Michálek, White-light interferometry – Envelope detection by Hilbert transform and influence of noise. Opt. Lasers. Eng. 50, 1063 – 1068 (2012).
  4. P. Pavlíček and O. Hýbl, White-light interferometry on rough surfaces—measurement uncertainty caused by noise, Appl. Opt. 51, 465 – 473 (2012).
  5. P. Pavlíček, Measurement uncertainty of white-light interferometry on optically rough surfaces, in: J. Awrejcewicz (Ed.), Numerical simulations of physical and engineering processes, InTech, Rijeka, 2011, pp. 491 – 502.
  6. P. Pavlíček and M. Takeda, Similarities and Differences between Spatial Coherence Profilometry and White-light Interferometry, In. Proc. of International Conference on Advanced Phase Measurement Methods in Optics and Imaging 2010, 16 – 21 May in Ascona, P. K. Rastogi and E. Hack eds., AIP Conference Proceedings 1236, pp 161-166.