The AFM-Raman System (NT-MDT, Russia) delivers nondestructive analysis of the sample topography, morphology and physico-chemical properties, including measurements of surface potential, elasticity, conductivity, magnetic domains etc. Sample thickness can be measured  with an atomic resolution, which allows to distinguish between numbers of atomic layers in 2D nanomaterials. The instrument is also equipped with a precisely aligned Raman microscope, which further allows to perform a correlative imaging of sample topography/morphology and Raman microscopy.


2D and 3D views of AFM image of Graphene Acid flakes on MICA substrate