Scanning Electron Microscopy (SEM)

Scanning electron microscopy (SEM) is a precise and non-destructive method for a detailed analysis of particles and other materials. From the images, it is possible to obtain information about the size, shape and surface structure of samples in the range of few nanometres. The use of the BSE detector enables to recognize different materials in alloys.  Thanks to EDS and WDS analyses, it is possible to identify the chemical composition of samples.

Surface of the thin film