X-Ray Photoelectron Spectroscopy (XPS) is an advanced, non-destructive technique for investigating the chemical composition of surfaces (co-called ESCA – electron spectroscopy for chemical analysis). It provides a unique opportunity to explore the topmost atomic layers of the studied solid materials and assign chemical states to the detected atoms.
Responsible persons:
Jan Filip, jan.filip@upol.cz, +420 585 63 4959
Martin Petr, martin.petr@upol.cz, +420 585 63 4485