Scanning Electron Microscopy (SEM)

Scanning electron microscopy (SEM) is a precise and non-destructive method for detailed analysis of particles and other materials. From the images it is possible to obtain information about size, shape and surface structure of  samples in the range of few nanometers. Using of the BSE detector gives opportunity to recognize different materials in alloys.  Due to EDS and WDS analysis it´s possible to identify chemical composion of  samples.

Surface of the thin film