Scanning electron microscopy (SEM) is a precise and non-destructive method for detailed analysis of particles and other materials. From the images it is possible to obtain information about size, shape and surface structure of samples in the range of few nanometers. Using of the BSE detector gives opportunity to recognize diﬀerent materials in alloys. Due to EDS and WDS analysis it´s possible to identify chemical composion of samples.
Surface of the thin film